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(parent: 845d9d1) | patch
Update TEST_I_F calls in ARM fp-int-convert tests.
authorJoseph Myers <joseph@codesourcery.com>
Mon, 22 Aug 2016 11:48:14 +0000 (12:48 +0100)
committerJoseph Myers <jsm28@gcc.gnu.org>
Mon, 22 Aug 2016 11:48:14 +0000 (12:48 +0100)
commit7ff4e41a19132c87c9ef6f0bd2ca809a6c2172a8
tree5bb3b715c52372f2e0b73bd893ced850cb49c5f9tree
parent845d9d1aa2b01d11e9c7e9949d5d134d760ba1b4commit | diff
Update TEST_I_F calls in ARM fp-int-convert tests.

gcc/testsuite:
* gcc.dg/torture/arm-fp16-int-convert-alt.c (FP16_MAX_EXP): New
macro.
(main): Update calls to TEST_I_F.
* gcc.dg/torture/arm-fp16-int-convert-ieee.c (FP16_MAX_EXP): New
macro.
(main): Update calls to TEST_I_F.

From-SVN: r239657
gcc/testsuite/ChangeLog diff | blob | history
gcc/testsuite/gcc.dg/torture/arm-fp16-int-convert-alt.c diff | blob | history
gcc/testsuite/gcc.dg/torture/arm-fp16-int-convert-ieee.c diff | blob | history