sim: cris: drop custom "dynamic" test field
authorMike Frysinger <vapier@gentoo.org>
Wed, 17 Nov 2021 00:40:00 +0000 (19:40 -0500)
committerMike Frysinger <vapier@gentoo.org>
Wed, 17 Nov 2021 01:06:44 +0000 (20:06 -0500)
commitb31ff1f79b561e29249d738fa9f076e58495035f
tree1d957407642be793a8b8d1fdda03f25718fe34ee
parent5ec501b5749c1df79b749a7fd885760dc734b31c
sim: cris: drop custom "dynamic" test field

This tag is used to force tests to be built dynamically (i.e. without
-static linking).  This is because cris-sim.exp in dejagnu turns on
static linking in ldflags.

The default configs and runtest flags shouldn't load these boards.
If these settings are still needed, we should figure out a different
way of suppressing the stock settings wholesale.  We want these to
all pass out of the box with little to no configuration so that they
can run in a multitarget build.

With dropping "dynamic", it'll be easier to merge the custom cris
test logic with the common sim test logic.
sim/testsuite/cris/c/badldso1.c
sim/testsuite/cris/c/badldso2.c
sim/testsuite/cris/c/badldso3.c
sim/testsuite/cris/c/c.exp
sim/testsuite/cris/c/hellodyn.c
sim/testsuite/cris/c/hellodyn2.c
sim/testsuite/cris/c/hellodyn3.c