all of which pass the testing criteria (equal to zero, less than zero).
The CR-based data-driven fail-on-first is new and not found in ARM
-SVE or RVV. It is extremely useful for reducing instruction count,
+SVE or RVV. At the same time it is also "old" because it is a generalisation
+of the Z80
+[Block compare](https://rvbelzen.tripod.com/z80prgtemp/z80prg04.htm)
+instructions, especially
+ It is extremely useful for reducing instruction count,
however requires speculative execution involving modifications of VL
to get high performance implementations. An additional mode (RC1=1)
effectively turns what would otherwise be an arithmetic operation