[AArch64] Add testcases for FAC, FCM changes.

gcc/testsuite/
	* gcc.target/aarch64/scalar-vca.c: New.
	* gcc.target/aarch64/vect-vca.c: Likewise.

From-SVN: r198496

diff --git a/gcc/testsuite/ChangeLog b/gcc/testsuite/ChangeLog
index dcc19cfd7e6d6daca090b54926d8aa72e2d54979..f6f7c3fad8dcd2e363ef6571a37c0cc136f63dbe 100644 (file)
--- a/gcc/testsuite/ChangeLog
+++ b/gcc/testsuite/ChangeLog
@@ -1,3 +1,8 @@
+2013-05-01  James Greenhalgh  <james.greenhalgh@arm.com>
+
+       * gcc.target/aarch64/scalar-vca.c: New.
+       * gcc.target/aarch64/vect-vca.c: Likewise.
+
 2013-05-01  James Greenhalgh  <james.greenhalgh@arm.com>
 
        * gcc.target/aarch64/scalar_intrinsics.c (force_simd): New.

diff --git a/gcc/testsuite/gcc.target/aarch64/scalar-vca.c b/gcc/testsuite/gcc.target/aarch64/scalar-vca.c
new file mode 100644 (file)
index 0000000..b118814
--- /dev/null
+++ b/gcc/testsuite/gcc.target/aarch64/scalar-vca.c
@@ -0,0 +1,72 @@
+/* { dg-do run } */
+/* { dg-options "-O3 --save-temps" } */
+
+#include <arm_neon.h>
+
+extern void abort (void);
+extern float fabsf (float);
+extern double fabs (double);
+
+#define NUM_TESTS 8
+
+float input_s1[] = {0.1f, -0.1f, 0.4f, 10.3f, 200.0f, -800.0f, -13.0f, -0.5f};
+float input_s2[] = {-0.2f, 0.4f, 0.04f, -100.3f, 2.0f, -80.0f, 13.0f, -0.5f};
+double input_d1[] = {0.1, -0.1, 0.4, 10.3, 200.0, -800.0, -13.0, -0.5};
+double input_d2[] = {-0.2, 0.4, 0.04, -100.3, 2.0, -80.0, 13.0, -0.5};
+
+#define TEST(TEST, CMP, SUFFIX, WIDTH, F)                              \
+int                                                                    \
+test_fca##TEST##SUFFIX##_float##WIDTH##_t (void)                       \
+{                                                                      \
+  int ret = 0;                                                         \
+  int i = 0;                                                           \
+  uint##WIDTH##_t output[NUM_TESTS];                                   \
+                                                                       \
+  for (i = 0; i < NUM_TESTS; i++)                                      \
+    {                                                                  \
+      float##WIDTH##_t f1 = fabs##F (input_##SUFFIX##1[i]);            \
+      float##WIDTH##_t f2 = fabs##F (input_##SUFFIX##2[i]);            \
+      /* Inhibit optimization of our linear test loop.  */             \
+      asm volatile ("" : : : "memory");                                        \
+      output[i] = f1 CMP f2 ? -1 : 0;                                  \
+    }                                                                  \
+                                                                       \
+  for (i = 0; i < NUM_TESTS; i++)                                      \
+    {                                                                  \
+      output[i] = vca##TEST##SUFFIX##_f##WIDTH (input_##SUFFIX##1[i],  \
+                                               input_##SUFFIX##2[i])   \
+                                                 ^ output[i];          \
+      /* Inhibit autovectorization of our scalar test loop.  */                \
+      asm volatile ("" : : : "memory");                                        \
+    }                                                                  \
+                                                                       \
+  for (i = 0; i < NUM_TESTS; i++)                                      \
+    ret |= output[i];                                                  \
+                                                                       \
+  return ret;                                                          \
+}
+
+TEST (ge, >=, s, 32, f)
+/* { dg-final { scan-assembler "facge\\ts\[0-9\]+, s\[0-9\]+, s\[0-9\]+" } } */
+TEST (ge, >=, d, 64, )
+/* { dg-final { scan-assembler "facge\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+" } } */
+TEST (gt, >, s, 32, f)
+/* { dg-final { scan-assembler "facgt\\ts\[0-9\]+, s\[0-9\]+, s\[0-9\]+" } } */
+TEST (gt, >, d, 64, )
+/* { dg-final { scan-assembler "facgt\\td\[0-9\]+, d\[0-9\]+, d\[0-9\]+" } } */
+
+int
+main (int argc, char **argv)
+{
+  if (test_fcages_float32_t ())
+    abort ();
+  if (test_fcaged_float64_t ())
+    abort ();
+  if (test_fcagts_float32_t ())
+    abort ();
+  if (test_fcagtd_float64_t ())
+    abort ();
+  return 0;
+}
+
+/* { dg-final { cleanup-saved-temps } } */

diff --git a/gcc/testsuite/gcc.target/aarch64/vect-vca.c b/gcc/testsuite/gcc.target/aarch64/vect-vca.c
new file mode 100644 (file)
index 0000000..c0cf2ef
--- /dev/null
+++ b/gcc/testsuite/gcc.target/aarch64/vect-vca.c
@@ -0,0 +1,89 @@
+/* { dg-do run } */
+/* { dg-options "-O3 --save-temps" } */
+
+#include <arm_neon.h>
+
+extern void abort (void);
+extern float fabsf (float);
+extern double fabs (double);
+
+#define NUM_TESTS 8
+
+float input_s1[] = {0.1f, -0.1f, 0.4f, 10.3f, 200.0f, -800.0f, -13.0f, -0.5f};
+float input_s2[] = {-0.2f, 0.4f, 0.04f, -100.3f, 2.0f, -80.0f, 13.0f, -0.5f};
+double input_d1[] = {0.1, -0.1, 0.4, 10.3, 200.0, -800.0, -13.0, -0.5};
+double input_d2[] = {-0.2, 0.4, 0.04, -100.3, 2.0, -80.0, 13.0, -0.5};
+
+#define TEST(T, CMP, SUFFIX, WIDTH, LANES, Q, F)                       \
+int                                                                    \
+test_vca##T##_float##WIDTH##x##LANES##_t (void)                                \
+{                                                                      \
+  int ret = 0;                                                         \
+  int i = 0;                                                           \
+  uint##WIDTH##_t output[NUM_TESTS];                                   \
+                                                                       \
+  for (i = 0; i < NUM_TESTS; i++)                                      \
+    {                                                                  \
+      float##WIDTH##_t f1 = fabs##F (input_##SUFFIX##1[i]);            \
+      float##WIDTH##_t f2 = fabs##F (input_##SUFFIX##2[i]);            \
+      /* Inhibit optimization of our linear test loop.  */             \
+      asm volatile ("" : : : "memory");                                        \
+      output[i] = f1 CMP f2 ? -1 : 0;                                  \
+    }                                                                  \
+                                                                       \
+  for (i = 0; i < NUM_TESTS; i += LANES)                               \
+    {                                                                  \
+      float##WIDTH##x##LANES##_t in1 =                                 \
+       vld1##Q##_f##WIDTH (input_##SUFFIX##1 + i);                     \
+      float##WIDTH##x##LANES##_t in2 =                                 \
+       vld1##Q##_f##WIDTH (input_##SUFFIX##2 + i);                     \
+      uint##WIDTH##x##LANES##_t expected_out =                         \
+       vld1##Q##_u##WIDTH (output + i);                                \
+      uint##WIDTH##x##LANES##_t out =                                  \
+       veor##Q##_u##WIDTH (vca##T##Q##_f##WIDTH (in1, in2),            \
+                           expected_out);                              \
+      vst1##Q##_u##WIDTH (output + i, out);                            \
+    }                                                                  \
+                                                                       \
+  for (i = 0; i < NUM_TESTS; i++)                                      \
+    ret |= output[i];                                                  \
+                                                                       \
+  return ret;                                                          \
+}
+
+#define BUILD_VARIANTS(T, CMP) \
+TEST (T, CMP, s, 32, 2,  , f)  \
+TEST (T, CMP, s, 32, 4, q, f)  \
+TEST (T, CMP, d, 64, 2, q,  )
+
+BUILD_VARIANTS (ge, >=)
+/* { dg-final { scan-assembler "facge\\tv\[0-9\]+\.2s, v\[0-9\]+\.2s, v\[0-9\]+\.2s" } } */
+/* { dg-final { scan-assembler "facge\\tv\[0-9\]+\.4s, v\[0-9\]+\.4s, v\[0-9\]+\.4s" } } */
+/* { dg-final { scan-assembler "facge\\tv\[0-9\]+\.2d, v\[0-9\]+\.2d, v\[0-9\]+\.2d" } } */
+
+BUILD_VARIANTS (gt, >)
+/* { dg-final { scan-assembler "facgt\\tv\[0-9\]+\.2s, v\[0-9\]+\.2s, v\[0-9\]+\.2s" } } */
+/* { dg-final { scan-assembler "facgt\\tv\[0-9\]+\.4s, v\[0-9\]+\.4s, v\[0-9\]+\.4s" } } */
+/* { dg-final { scan-assembler "facgt\\tv\[0-9\]+\.2d, v\[0-9\]+\.2d, v\[0-9\]+\.2d" } } */
+
+/* No need for another scan-assembler as these tests
+   also generate facge, facgt instructions.  */
+BUILD_VARIANTS (le, <=)
+BUILD_VARIANTS (lt, <)
+
+#undef TEST
+#define TEST(T, CMP, SUFFIX, WIDTH, LANES, Q, F)       \
+if (test_vca##T##_float##WIDTH##x##LANES##_t ())       \
+  abort ();
+
+int
+main (int argc, char **argv)
+{
+BUILD_VARIANTS (ge, >=)
+BUILD_VARIANTS (gt, >)
+BUILD_VARIANTS (le, <=)
+BUILD_VARIANTS (lt, <)
+  return 0;
+}
+
+/* { dg-final { cleanup-saved-temps } } */