From: lkcl Date: Sun, 14 Nov 2021 09:46:29 +0000 (+0000) Subject: (no commit message) X-Git-Tag: opf_rfc_ls005_v1~3429 X-Git-Url: https://git.libre-soc.org/?a=commitdiff_plain;h=0dbb4698c2b2cdff264b61609a5325957ab308ac;p=libreriscv.git --- diff --git a/docs/pinmux.mdwn b/docs/pinmux.mdwn index 1f2167205..7ff7be4c6 100644 --- a/docs/pinmux.mdwn +++ b/docs/pinmux.mdwn @@ -1,5 +1,19 @@ # Pinmux, IO Pads, and JTAG Boundary scan +Managing IO on an ASIC is nowhere near as simple as on an FPGA. +An FPGA has built-in IO Pads, the wires terminate inside an +existing silicon block which has been tested for you. + +Designing an ASIC, there is no guarantee that the IO pad is +working when manufactured. Worse, the peripheral could be +faulty. How can you tell what the cause is? There are two +possible faults, but only one symptom ("it dunt wurk"). +This problem is what JTAG Boundary Scan is designed to solve. +JTAG can be operated +at very low clock frequencies (5 khz is perfectly acceptable) +so there is very little risk of clock skew during that testing. + +